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Product Name:Photoluminescence Spectrometer

Model: OmniPL

Supplier: Zolix

Photoluminescence Spectrometer-OmniPL


The measurement of photoluminescence from semi-conductor materials has become an important characterisation method and is widely accepted to provide information on for example: carrier doping levels, alloy compositions, film structures, band gap and edge effects, etc. in applications ranging from scientific research, process monitoring, or device characterisation.
The standard ZLX-PL system is configured for the measurement of samples at room temperature and can be extended to include samples in either a nitrogen or helium cryostat for low temperature processes.


Diagram of System


Fluorescence Spectrometer                     FluoroSENS Steady-state Fluorescence Spectrometer

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